Summary
Jessica Engler, CIPP/US, is an associate in the New Orleans office of Kean Miller. She joined the firm in 2013 and practices in the intellectual property, construction, and data security groups. Jessica has experience in the many aspects of intellectual property including patents, trademarks, trade secrets, trade dress, and copyrights.Jessica?s experience in intellectual property matters spans a wide range of technologies including electronic devices, medical devices, electric power protection, and construction materials. As a registered patent attorney, Jessica drafts, files, and prosecutes patents before the United States Patent and Trademark Office in various technologies and industries including electronics and circuit design, power systems designs, medical devices, manufacturing, and consumer and industrial products. In addition to the experience in filing and prosecuting applications to obtain intellectual property rights, she has experience in drafting assignment and licensing agreements concerning the various intellectual property rights.Jessica?s technical background is also utilized in her data security practice, where she advises clients on data breaches and privacy-related legal challenges. She assists clients in responding to breaches, evaluating corporate compliance, assessing prevention strategies, performing third party vendor risk assessments, and creating incident management plans. Jessica also defends clients that are threatened with litigation after a breach.Jessica has also assisted with the litigation of building defect claims and payment disputes, defense of professionals before LAPELS, public bid protests, and evaluation of construction contracts. She is experienced in mediation and arbitration, including international arbitration.Jessica has been awarded the ANSI-accredited Certified Information Privacy Professional for the U.S. Private Sector (CIPP/US) designation by the International Association of Privacy Professionals.
View More ?
https://www.keanmiller.com/jessica-c-engler.html
